Stefan Zollner

Department Head/Professor: Department of Physics | (575) 646-762


The Ellipsometry group at New Mexico State University is a research group led by Department Head Dr. Stefan Zollner. We specialize in the characterization of the electronic and atomic structures of thin films and bulk materials. By use of a variable angle spectroscopic ellipsometer and a cryostat we are able to precisely study the temperature and strain dependence of a materials dielectric function among other things. X-Ray diffraction and reflectance allows us to determine the film quality, thickness, relative orientation to the substrate, etc.

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